Call for Papers for the Gold-level Open Access Book: Geography According to ChatGPT

Aims and Scope

The book series Frontiers in Artificial Intelligence and Applications (FAIA) covers all aspects of theoretical and applied Artificial Intelligence research in the form of monographs, selected doctoral dissertations, handbooks and proceedings volumes. The FAIA series contains several sub-series, including 'Information Modelling and Knowledge Bases' and 'Knowledge-Based Intelligent Engineering Systems'. It also includes the biennial European Conference on Artificial Intelligence (ECAI) proceedings volumes, and other EurAI (European Association for Artificial Intelligence, formerly ECCAI) sponsored publications. The series has become a highly visible platform for the publication and dissemination of original research in this field. Volumes are selected for inclusion by an international editorial board of well-known scholars in the field of AI. All contributions to the volumes in the series have been peer reviewed.

The FAIA series is indexed in ACM Digital Library; DBLP; EI Compendex; Google Scholar; Scopus; Web of Science: Conference Proceedings Citation Index - Science (CPCI-S) and Book Citation Index - Science (BKCI-S); Zentralblatt MATH.

Book series editors

Nicola Guarino Laboratory for Applied Ontology (LOA) ISTC-CNR Italy
Pascal Hitzler Endowed Lloyd T. Smith Creativity in Engineering Chair Center for Artificial Intelligence and Data Science (CAIDS) Kansas State University USA
Joost N. Kok Dean of the Faculty of EEMCS University of Twente The Netherlands
Jiming Liu Department of Computer Science Hong Kong Baptist University Honk Kong
Ramon López de Mántaras Artificial Intelligence Research Institute Spanish National Research Council Spain
Riichiro Mizoguchi Institute of Scientific and Industrial Research Osaka University Japan
Mark Musen Stanford Center for Biomedical Informatics Research Stanford University USA
Sankar K. Pal Indian Statistical Institute India
Ning Zhong Department of Life Science and Informatics Maebashi Institute of Technology Japan

Abstracting/Indexing

Books from this Series