Atomistic simulation of Cu/Ta thin film deposition and other phenomena Authors Klaver, P. Publication date January 2004 # of pages 94 Cover Softcover ISBN print 978-90-407-2526-5 Imprint Delft University Press Subjects Natural Sciences, Physics €25.00 US$36.00 Excl. VAT View Content Order BookPrint Book Related Publications Book New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science Publication date December 2021 Editors Milton, M.J.T., Wiersma, D.S., Williams, C.J., Sega, M. Subjects Physics, Data Science, Chemistry more details Journal Journal of Neutron Research ISSN print 1023-8166 ISSN online 1477-2655 Subjects Physics, Natural Sciences, Chemistry More Details Journal International Journal of Applied Electromagnetics and Mechanics ISSN print 1383-5416 ISSN online 1875-8800 Subjects Technology, Engineering & Architecture, Engineering, Natural Sciences, Physics More Details
Book New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science Publication date December 2021 Editors Milton, M.J.T., Wiersma, D.S., Williams, C.J., Sega, M. Subjects Physics, Data Science, Chemistry more details
Journal Journal of Neutron Research ISSN print 1023-8166 ISSN online 1477-2655 Subjects Physics, Natural Sciences, Chemistry More Details
Journal International Journal of Applied Electromagnetics and Mechanics ISSN print 1383-5416 ISSN online 1875-8800 Subjects Technology, Engineering & Architecture, Engineering, Natural Sciences, Physics More Details
